Prueba de las características eléctricas de los semiconductores SMU Unidad S100 DC 30V 1A SMU Medida
Precio: Negotiable
MOQ: 1 unit
El tiempo de entrega: 2-8 weeks
Marca: PRECISE INSTRUMENT
Destacar:Semiconductor Electrical Characteristics Testing SMU Unit, DC S100 SMU Unit, S100 30V 1A SMU Measurement
Semiconductor Electrical Characteristics Testing SMU Unit S100 DC 30V 1A SMU Measurement The S100 Source Measure Unit, meticulously crafted by PRECISE INSTRUMENT, is an outstanding representative of domestic testing equipment. It breaks the long-standing monopoly of foreign technology and delivers a... Ver más
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Unidad DP100B de medidor de fuente de doble canal de 30V 30A con medición de voltaje / corriente
Precio: Negotiable
MOQ: 1 unit
El tiempo de entrega: 2-8 weeks
Marca: PRECISE INSTRUMENT
Destacar:30V 30A Dual Channel Source Meter, DP100B Source Meter Unit, Voltage Current SMU unit
30V 30A Dual Channel Source Meter Unit DP100B With Voltage / Current Measurement The DP100B dual channel high precision desktop pulse source measure unit is the newly developed high precision, large dynamic, digital touch source measure unit that based on the single channel pulse desktop source meas... Ver más
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Unidad de medición de la fuente de pulso de 18V 1A de cuatro canales de tarjeta de subcarácter CBI403 SMU
Precio: Negotiable
MOQ: 1 unit
El tiempo de entrega: 2-8 weeks
Marca: PRECISE INSTRUMENT
Destacar:18V 1A Four Channel Source Measure, Sub Card Pulse Source Measure Unit, CBI403 SMU Measurement
18V 1A Four Channel Sub Card Pulse Source Measure Unit CBI403 SMU Measurement The CBI401 modular subcard is a member of the CS Series Source Measure Unit (SMU) family, designed for high-precision, high-dynamic-range electrical characterization. Its modular architecture allows flexible integration wi... Ver más
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300A 30V Fuente de alimentación de pulso de alta corriente HCPL030 para SiC IGBT GaN HEMT prueba
Precio: Negotiable
MOQ: 1 unit
El tiempo de entrega: 2-8 weeks
Marca: PRECISE INSTRUMENT
Destacar:300A 30V Pulse Power Supply, 300A 30V High Current Source, HEMT Test Pulse Power Supply
300A 30V Pulse Power Supply High Current Source HCPL030 For SiC IGBT GaN HEMT Test The HCPL030 series high - current pulse power supply is a pulse constant - current source. The product features steep output pulse edges (10μs), high testing efficiency (40ms, with external control relay), support for... Ver más
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Unidad de medición de la fuente de alimentación de alta tensión de 1200V 100mA para el ensayo de tensión de avería IGBT
Precio: Negotiable
MOQ: 1 unit
El tiempo de entrega: 2-8 weeks
Marca: PRECISE INSTRUMENT
Destacar:High Voltage Power Source Measure Unit, 1200V 100mA High Voltage Power Source, IGBT Breakdown High Voltage Power Source
1200V/100mA High Voltage Power Source for IGBT Breakdown Voltage Test The E100 is a high-performance high voltage source measure unit specifically designed for high voltage testing environments. It can output and measure voltages up to 1200V, and accurately measure weak current signals as low as 1nA... Ver más
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20A CW / 20A QCW Prueba de fuente de alimentación láser HCPL002 Fuente de alimentación láser de diodo de alta potencia
Precio: Negotiable
MOQ: 1 unit
El tiempo de entrega: 2-8 weeks
Marca: PRECISE INSTRUMENT
Destacar:20A QCW Testing Laser Power Supply, 20A CW Testing Laser Power Supply, HCPL002 Diode Laser Power Supply
20A CW / 20A QCW Testing Laser Power Supply HCPL002 High Power Diode Laser Power Supply HCPL002 is a high-power laser test power supply designed to meet the most demanding test needs with advanced technology. It has CW and QCW output capabilities, and the CW and QCW currents can reach up to 20A, pro... Ver más
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1MS/S Tarjeta de adquisición de datos A400 4 canales Tarjeta Daq de resolución ADC de 16 bits
Precio: Negotiable
MOQ: 1 unit
El tiempo de entrega: 2-8 weeks
Marca: PRECISE INSTRUMENT
Destacar:A400 Data Acquisition Card, 16 Bit ADC Resolution Daq Card, 4 Channels Data Acquisition Card
1MS/S A400 Data Acquisition Card 4 Channels 16 Bit ADC Resolution Daq Card A400 data acquisition card is a plug-in card type independently designed and developed by Psysi, which supports variable rate sampling and large-capacity data storage, with 4 channels in a single card and up to 40 channels in... Ver más
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Sistemas de prueba de semiconductores de envejecimiento láser LDBI Sistema de prueba multicanal
Precio: Negotiable
MOQ: 1 unit
El tiempo de entrega: 2-8 weeks
Marca: PRECISE INSTRUMENT
Destacar:Laser Aging Semiconductor Test Systems, LDBI Semiconductor Test Systems, Multi Channel Power Device Analyzer
LDBI Laser Aging Semiconductor Test Systems Multi Channel Testing System LDBI multi-channel high-power laser aging system is specifically designed to address the issues of kilowatt-level high-power semiconductor laser chips and pump laser modules that require narrow pulse high current testing and ag... Ver más
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